Characterization of conductive elastomers:
- Conductivity under linear and radial strain
- Endurance testing: conductivity under cyclical linear strain
- 2 point / 4 point measurement using LCR meter
Broadband Dielectric Spectroscopy:
- Determination of capacity, specific conductivity, impedance, permittivity and loss factor
- Parameters: Frequency range 10-5 to 107 Hz, temperature range -150 °C to approx. 400 °C, voltage up to +/- 500 V)
- Equipment: Novocontrol, Type Alpha-A Analyzer with Quatro Cryosystem, ZGS Alpha Active Sample Cell and High Voltage Test Interface HVB1000
Characterization of semiconductors:
- Determination of precise (low) current and voltage (semiconductor) characteristics
- Parameters: sub-pA level up to 1.05 A DC. / max. voltage 42 V
- Diodes: 2-wire (non-kelvin) or 4-wire (kelvin) connections
- Transistors: 2-wire (non-kelvin) connection, drain-current over drain-/gate-voltage
- Equipment: Keysight Source Measurement Unit B2912 (dual channel) + test fixtures (dark ambient) + triaxial connections